Subject
Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation
Cited by
7 articles.
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1. The development of vacuum measurements down to extremely high vacuum – XHV;Measurement;2013-02
2. Measurement of residual currents in ionization gauges and residual gas analyzers;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;1992-07
3. An axial‐emission bent beam gauge;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;1990-09
4. An axial-emission bent beam gauge;Vacuum;1990-01
5. Thermionic cathode ionization gauges;Total and Partial Pressure Measurement in Vacuum Systems;1989