Author:
Jiarui Liu,Peiran Zhu,Aiguo Feng,Dawan Li
Subject
Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation
Cited by
3 articles.
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1. A new setup for elastic recoil analysis using ion induced electron emission for particle identification;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1998-03
2. Elastic recoil detection analysis using ion-induced electron emission for particle identification;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1994-03
3. Analysis by absorption and scattering of radiation;Journal of Radioanalytical and Nuclear Chemistry Articles;1991-02