Electron trajectories and ion current characteristics of orbitron vacuum gauges-Reference-Cited by-同舟云学术

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Electron trajectories and ion current characteristics of orbitron vacuum gauges

Published:1967-07 Issue:7 Volume:17 Page:379-385
ISSN:0042-207X
Container-title:Vacuum
language:en
Short-container-title:Vacuum

Author:

Gammon R.B.

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation

Reference14 articles.

1. Extension of the Low Pressure Range of the Ionization Gauge

2. Scientific Foundations of Vacuum Technique;Dushman,1962

3. D Gabor, British Patent No 887, 251, (1962).

4. Project Report for the Degree of B Tech;Gammon,1965

Cited by 10 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. History of ultrahigh vacuum pressure measurements;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;1994-07

2. Ultrahigh vacuum pressure measurements: Limiting processes;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;1987-09

3. Gauges for Low-Pressure Measurement;Total Pressure Measurements in Vacuum Technology;1985

4. Influence of ionization phenomena and electron space charge on condition of electronic injection into an orbitron device;Vacuum;1978-01

5. Performance of the modified orbitron pump;Journal of Vacuum Science and Technology;1977-03

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