4.2 Monitoring of optical thin films using a quartz crystal monitor-Reference-Cited by-同舟云学术

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4.2 Monitoring of optical thin films using a quartz crystal monitor

Published:1977-06 Issue:4 Volume:27 Page:391-397
ISSN:0042-207X
Container-title:Vacuum
language:en
Short-container-title:Vacuum

Author:

vd Laan C.J.,Frankena H.J.

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation

Reference12 articles.

1. Thin-Film Optical Filters;Macleod,1969

2. Balzers Betriebsanleitung A 11-01 d. Hochvakuum-Bedampfungsanlage BA 500.

3. Balzers Betriebsanleitung A 11-3995 d. Optische Schichtdicken-Messeinrichtung GSM 210.

4. Balzers Betriebsanleitung A 11-3918 d. Hochvakuum-Bedampfungsanlage BA 510 Automatic.

5. Balzers Betriebsanleitung A 11-4000 d. Schwingquartz-Schichtdickenmessgerät QSG 201.

Cited by 10 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Film Thickness;Coatings on Glass;1999

2. A simple in-situ optical film thickness monitor for infrared coatings;Thin Solid Films;1997-07

3. Synthesis and research of the optimum conditions for the optical monitoring of non-quarter-wave multilayers;Applied Optics;1993-10-01

4. Experimental studies of inhomogeneous coatings for optical applications;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;1991-05

5. Thickness measurement using Young’s interferometric experiment;Applied Optics;1988-09-15

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