Angular corrections for determining the electron inelastic mean free path (IMFP) by elastic peak electron spectroscopy
Author:
Publisher
Elsevier BV
Subject
Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation
Reference20 articles.
1. The inelastic mean free path of electrons in some semiconductor compounds and metals
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2. Effect of surface roughness on EPES and AREPES measurements: Flat and crenels silicon surfaces;Surface Science;2008-06
3. A Monte Carlo study for electron elastic backscattering based on layered models for substrates;Mathematics and Computers in Simulation;1998-08
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