Analysis of hydrogen isotopes in materials by secondary ion mass spectrometry and nuclear microanalysis-Reference-Cited by-同舟云学术

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Analysis of hydrogen isotopes in materials by secondary ion mass spectrometry and nuclear microanalysis

Published:1994-04 Issue:4 Volume:45 Page:375-387
ISSN:0042-207X
Container-title:Vacuum
language:en
Short-container-title:Vacuum

Author:

Ross GG

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation

Reference83 articles.

1. Secondary Ion Mass Spectrometry: Basic concepts, instrumental aspects, applications and trends;Benninghoven,1987

2. LXXXIII. Rays of positive electricity

3. Sputtering of Surfaces by Positive Ion Beams of Low Energy

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4. Non-classical applications of chemical analysis based on nuclear activation;Journal of Radioanalytical and Nuclear Chemistry;2019-12-05

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