The effect of fabrication variables on chromium thin film resistors-Reference-Cited by-同舟云学术

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The effect of fabrication variables on chromium thin film resistors

Published:1963-06 Issue:6 Volume:13 Page:213-221
ISSN:0042-207X
Container-title:Vacuum
language:en
Short-container-title:Vacuum

Author:

Chapman R.M.

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation

Reference14 articles.

1. Study of Physical Characteristics of Thin Film Resistor Elements;Moore;WADC Technical Report,1960

2. Recent Developments in Conduction Phenomena in Thin Metal Films;Mayer,1959

3. Atomic Theory for Students of Metallurgy;Hume-Rothery,1955

4. The Theory of the Properties of Metals and Alloys;Mott,1958

5. Conduction Processes in Thin Deposits of Antimony;Harris;Phys. Rev.,1949

Cited by 9 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Compact chromium oxide thin film resistors for use in nanoscale quantum circuits;Journal of Applied Physics;2014-12-14

2. Electrical and structural characteristics of chromium thin films deposited on glass and alumina substrates;Thin Solid Films;1997-06

3. Some transport properties of transition metal films;Journal of Materials Science;1985-03

4. 1.15 Deposition of thin chromium films on substrates heated between room temperature and 300°C in the uhv chamber of an annular cryopump;Vacuum;1977-01

5. Effect of grain size on optical and electrical properties of vacuum evaporated thin chromium films;Thin Solid Films;1972-11

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