Uhv and xhv pressure measurements
Author:
Publisher
Elsevier BV
Subject
Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation
Reference45 articles.
1. Residual currents in several commercial ultrahigh vacuum Bayard–Alpert gauges
2. Investigation on the low pressure limit of the Bayard–Alpert gauge
3. F Watanabe, Personal communication (ICF070 gauge, Sukegawa Electric Co).
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