Unified dual for bi-class SVM approaches-Reference-Cited by-同舟云学术

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Unified dual for bi-class SVM approaches

Published:2005-10 Issue:10 Volume:38 Page:1772-1774
ISSN:0031-3203
Container-title:Pattern Recognition
language:en
Short-container-title:Pattern Recognition

Author:

González L.,Angulo C.,Velasco F.,Català A.

Publisher

Elsevier BV

Subject

Artificial Intelligence,Computer Vision and Pattern Recognition,Signal Processing,Software

Reference4 articles.

1. Statistical Learning Theory;Vapnik,1998

2. A. Shashua, A. Levin, Taxonomy of large margin principle algorithms for ordinal regression problems, Neural Inf. Process. Syst. 16.

3. Duality and geometry in svm classifiers;Bennett,2000

4. Maximal margin classification for metric spaces;Hein,2003

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