Full ranking as local descriptor for visual recognition: A comparison of distance metrics on sn-Reference-Cited by-同舟云学术

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Full ranking as local descriptor for visual recognition: A comparison of distance metrics on sn

Published:2015-04 Issue:4 Volume:48 Page:1328-1336
ISSN:0031-3203
Container-title:Pattern Recognition
language:en
Short-container-title:Pattern Recognition

Author:

Chan Chi Ho,Yan Fei,Kittler Josef,Mikolajczyk Krystian

Funder

EU Chist-Era EPSRC EP/K01904X/1 Visual Sensen

EU FP7 284989 Biometrics Evaluation and Testing (BEAT)

Publisher

Elsevier BV

Subject

Artificial Intelligence,Computer Vision and Pattern Recognition,Signal Processing,Software

Reference40 articles.

1. T. Ahonen, J. Matas, C. He, M. Pietikäinen, Rotation invariant image description with local binary pattern histogram Fourier features, in: Scandinavian Conference on Image Analysis, 2009.

2. A. Alahi, R. Ortiz, P. Vandergheynst, FREAK: fast regina keypoint, in: CVPR, 2012.

3. M. Calonder, V. Lepetit, C. Strecha, P. Fua, BRIEF: binary robust independent elementary features, in: ECCV, 2010.

4. A completed modeling of local binary pattern operator for texture classification;Guo;IEEE Trans. Image Process.,2010

5. Description of interest regions with local binary patterns;Heikkilä;Pattern Recognit.,2009

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