Metric learning via perturbing hard-to-classify instances-Reference-Cited by-同舟云学术

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Metric learning via perturbing hard-to-classify instances

Published:2022-12 Issue: Volume:132 Page:108928
ISSN:0031-3203
Container-title:Pattern Recognition
language:en
Short-container-title:Pattern Recognition

Author:

Guo Xinyao,Wei Wei^ORCID,Liang Jianqing,Dang Chuangyin^ORCID,Liang Jiye

Funder

National Natural Science Foundation of China

National Key Research and Development Program of China

Publisher

Elsevier BV

Subject

Artificial Intelligence,Computer Vision and Pattern Recognition,Signal Processing,Software

Reference40 articles.

1. Asymmetric metric learning for knowledge transfer;Budnik,2021

2. Multi-view geometric mean metric learning for kinship verification;Hu,2019

3. Deep features for person re-identification on metric learning;Wu;Pattern Recognit.,2020

4. Information-theoretic metric learning;Davis,2007

5. Distance metric learning for large margin nearest neighbor classification;Weinberger;J. Mach. Learn. Res.,2009

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1. Zero-shot sketch-based image retrieval via adaptive relation-aware metric learning;Pattern Recognition;2024-08

2. A novel metric learning method based on constructing a uniform data hypersphere via simulated forging approach;Neural Computing and Applications;2024-05-13

3. A bi-level metric learning framework via self-paced learning weighting;Pattern Recognition;2023-07

4. Feature Fusion and NRML Metric Learning for Facial Kinship Verification;JUCS - Journal of Universal Computer Science;2023-04-28

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