Author:
Yu Honglu,MacGregor John F.
Subject
Spectroscopy,Process Chemistry and Technology,Computer Science Applications,Software,Analytical Chemistry
Reference15 articles.
1. Proceedings of SPIE, vol. 3836, Proceedings of the 1999 Machine Vision Systems for Inspection and Metrology VIII, 21 22 Sep 1999, Boston, MA, USA;Pla,1999
2. High contrast ultrasound images of defects in food package seals
3. Estimation of the surface concentration of adhered particles by color imaging
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