An active piezoelectric probe for precision measurement on a CMM

Author:

Bittle Steven D.,Kurfess Thomas R.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Computer Science Applications,Mechanical Engineering,Control and Systems Engineering

Reference13 articles.

1. Automated inspection for flexible manufacturing;Hales;Manufacturing Systems,1985

2. Investigation into the performance of probes on CMMs;Butler;Industrial Metrology,1991

3. The applicability of a laser triangulation probe to non-contacting inspection;Goh;International Journal of Production Research,1986

4. Laser adds light touch to CMMs;Somerville;Machine and Tool Blue Book,1987

5. Milling cutter runout compensation by control of radial depth of cut;Liang,1992

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