Local analysis of semiconductor nanoobjects by scanning tunneling atomic force microscopy-Reference-Cited by-同舟云学术

Local analysis of semiconductor nanoobjects by scanning tunneling atomic force microscopy

Published:2015-03 Issue:1 Volume:1 Page:15-23
ISSN:2405-7223
Container-title:St. Petersburg Polytechnical University Journal: Physics and Mathematics
language:en
Short-container-title:St. Petersburg Polytechnical University Journal: Physics and Mathematics

Author:

Lashkova Natalia A.,Permiakov Nikita V.,Maximov Alexander I.,Spivak Yulia M.,Moshnikov Vyacheslav A.

Publisher

Elsevier BV

Reference22 articles.

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4. Osnovy skaniruyushchej zondovoj mikroskopii (Scanning Probe Microscopy) Ucheb. pos;Mironov,2004

5. Tunnel'naya atomno-silovaya mikroskopiya tverdotel'nykh nanostruktur. Avtoref. dis. … dokt. fiz.-mat. nauk (Tunneling Atomic Force Microscopy. Dr. Tech. Sci. Diss.), Nizhnij Novgorod;Filatov,2013

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