Evaluations of the intrinsic stress value in silicon wafers from photovoltage measurements-Reference-Cited by-同舟云学术

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Evaluations of the intrinsic stress value in silicon wafers from photovoltage measurements

Published:2000-09 Issue:2 Volume:288 Page:177-181
ISSN:0921-5093
Container-title:Materials Science and Engineering: A
language:en
Short-container-title:Materials Science and Engineering: A

Author:

Patrin A.

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference11 articles.

1. Physical Theory of Semiconductor Surfaces

2. Semiconductor profiling using an optical probe

3. Evaluation of Silicon Optical Absorption Data for Use in Minority‐Carrier‐Diffusion‐Length Measurements by the SPV Method

4. ASTM Standard F391-96a, 1996.

5. (a) A. Patrin, in: Proceedings of Seventh European Conference ECASIA-97, Goteborg, Wiley, 1998;

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1. Didactic software for solar cells and materials parameters analysis;Solar Energy Materials and Solar Cells;2005-05

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