Analysis of traps in high quality CVD diamond films through the temperature dependence of carrier dynamics-Reference-Cited by-同舟云学术

Analysis of traps in high quality CVD diamond films through the temperature dependence of carrier dynamics

Published:2003-10 Issue:10-11 Volume:12 Page:1733-1737
ISSN:0925-9635
Container-title:Diamond and Related Materials
language:en
Short-container-title:Diamond and Related Materials

Author:

Marinelli Marco,Milani E,Paoletti A,Pucella G,Tucciarone A,Verona Rinati G,Angelone M,Pillon M

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Materials Chemistry,Mechanical Engineering,General Chemistry,Electronic, Optical and Magnetic Materials

Reference13 articles.

1. W. Adam, C. abuer, E. Bedermann, F. Bogani, E. Borchi, M. Bruzzi et al. (RD42 coll.), Electrochemical Society 5th Symposiumon on Diamond Materials Proceedings, 1998, p. 491

2. Recent results on CVD diamond radiation sensors

3. Development of diamond films for particle detector applications

4. High-quality diamond grown by chemical-vapor deposition: Improved collection efficiency in α-particle detection

5. Systematic study of the normal and pumped state of high efficiency diamond particle detectors grown by chemical vapor deposition

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