A comparison of optical and X-ray CT technique for void analysis in soil thin section-Reference-Cited by-同舟云学术

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A comparison of optical and X-ray CT technique for void analysis in soil thin section

Published:2007-09 Issue:1-2 Volume:141 Page:60-70
ISSN:0016-7061
Container-title:Geoderma
language:en
Short-container-title:Geoderma

Author:

Elliot Thomas R.,Heck Richard J.

Publisher

Elsevier BV

Subject

Soil Science

Reference27 articles.

1. Statistical Methods;Arkin,1956

2. Fabric and Mineral Analysis of Soils;Brewer,1976

3. Geological applications of high-resolution X-ray computed tomography in petrology, meteoritics and palaeontology;Carlson,2003

4. DX Soil, a library for 3D image analysis in soil science;Delerue;Comput. Geotech.,2002

5. 3D soil image characterization applied to hydraulic properties computation;Delerue,2003

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