6.2 Crystallite Size and Lamellar Thickness by X-Ray Methods-Reference-Cited by-同舟云学术

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6.2 Crystallite Size and Lamellar Thickness by X-Ray Methods

Published:1980 Issue: Volume: Page:128-184
ISSN:0076-695X
Container-title:Polymers - Crystal Structure and Morphology
language:
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Author:

Wang Jing-I,Harrison Ian R.

Publisher

Elsevier

Reference102 articles.

1. X-ray Diffraction Methods in Polymer Science;Alexander,1969

2. X-Ray Diffraction Procedures of Polycrystalline and Amorphous Materials;Klug,1974

3. X-Ray Diffraction by Polymers;Kakudo,1972

4. Routine Crystallite-Size Determination by X-Ray Diffraction Line Broadening

5. X-ray Diffraction in Crystals, Imperfect Crystals and Amorphous Bodies;Guinier,1963

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