X-ray diffuse scattering simulations in the Huang region for Si crystals with microdefects of orthorhombic symmetry
Author:
Publisher
Elsevier BV
Subject
Computational Mathematics,General Physics and Astronomy,Mechanics of Materials,General Materials Science,General Chemistry,General Computer Science
Reference15 articles.
1. X-ray diffraction phenomena in elastically distorted crystals
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3. The Coherence Description of the Dynamical X-Ray Diffraction from Randomly Disordered Crystals I. General Formalism
4. On the statistical dynamical theory of diffraction: application to silicon
Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. X-ray High-Resolution Diffractometry for Studies of Diffuse Scattering in Semiconductor Materials;Crystal Research and Technology;2001-10
2. Orthorhombic microdefects in Si crystals;Journal of Physics D: Applied Physics;2001-05-01
3. High-resolution characterization of microdefects by X-ray diffuse scattering;Philosophical Transactions of the Royal Society of London. Series A: Mathematical, Physical and Engineering Sciences;1999-10
4. X-ray diffuse scattering from extended microdefects of orthorhombic symmetry for Si single crystals;Journal of Alloys and Compounds;1999-05
5. X-ray diffuse scattering characterization of microdefects in highly Te-doped annealed GaAs crystals;Journal of Physics D: Applied Physics;1998-08-07
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