Evaluation of the gap state distribution in a-Si:H by SCLC measurements
Author:
Publisher
Elsevier BV
Subject
Surfaces, Coatings and Films,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials
Reference14 articles.
1. Hydrogenated Amorphous Silicon;Street,1991
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3. W. den Boer, Determination of midgap density of states in a-Si:H using space charge limited current measurements, J. Phys. (Paris) 42 (1981) C4-451–454.
4. Use of space charge limited current measurements to determine the properties of energetic distributions of bulk traps;Nespurek;J. Appl. Phys.,1980
5. The density of states in amorphous silicon determined by space charge limited current measurements;Mackenzie;Phil. Mag.,1982
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