Electrical switching, local structure and thermal crystallization in Al-Te glasses
Author:
Funder
Department of Science & Technology (DST) of India
Publisher
Elsevier BV
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Reference39 articles.
1. Reversible electrical switching phenomena in disordered structures;Ovshinsky;Phys. Rev. Lett.,1968
2. Phase change materials and their application to nonvolatile memories;Raoux;Chem. Rev.,2010
3. Progress in understanding the Ovshinsky Effect: threshold switching in chalcogenide amorphous semiconductors;Hudgens;Phys. Status Solidi (B),2012
4. Physics of switching and memory effects in chalcogenide glassy semiconductors;Bogoslovskiy;Semiconductors,2012
5. Threshold switching in chalcogenideglass thin films;Adler;J. Appl. Phys.,1980
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