Some theoretical foundations of analog signal shape design for measurement and testing-Reference-Cited by-同舟云学术

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Some theoretical foundations of analog signal shape design for measurement and testing

Published:1996-01 Issue:1 Volume:17 Page:29-37
ISSN:0263-2241
Container-title:Measurement
language:en
Short-container-title:Measurement

Author:

Zielonko R.

Publisher

Elsevier BV

Subject

Applied Mathematics,Electrical and Electronic Engineering,Condensed Matter Physics,Instrumentation

Reference17 articles.

1. Data patterns for phase shift keyed symbolic identification;Henderson,1994

2. Fault dictionary based upon stimulus design;Schreiber;IEEE Trans. Circuits and Systems,1979

3. Application of special-shape signals to measurements for the purpose of electronic systems testing;Królikowski;ACTA IMEKO,1979

4. Diagnosis of analog circuits and systems via Walsh functions;Tlaga,1981

5. New results in test signal optimization for measuring elements of electrical circuits;Królikowski;ACTA IMEKO,1985

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