Fast electron tomography: Applications to beam sensitive samples and in situ TEM or operando environmental TEM studies-Reference-Cited by-同舟云学术

Fast electron tomography: Applications to beam sensitive samples and in situ TEM or operando environmental TEM studies

Published:2019-05 Issue: Volume:151 Page:480-495
ISSN:1044-5803
Container-title:Materials Characterization
language:en
Short-container-title:Materials Characterization

Author:

Koneti Siddardha,Roiban Lucian,Dalmas Florent,Langlois Cyril,Gay Anne-Sophie^ORCID,Cabiac Amandine,Grenier Thomas,Banjak Hussein,Maxim Voichiţa,Epicier Thierry

Funder

IFP Energies Nouvelles

INSA Lyon

French National Research Agency

METSA

Université de Lyon

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference96 articles.

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