The measurement of the dislocation density using TEM-Reference-Cited by-同舟云学术

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The measurement of the dislocation density using TEM

Published:2021-05 Issue: Volume:175 Page:111065
ISSN:1044-5803
Container-title:Materials Characterization
language:en
Short-container-title:Materials Characterization

Author:

Meng Yang,Ju Xinhua,Yang Xiaopeng

Funder

University of Science and Technology Beijing

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference10 articles.

1. An experimental determination of electrical resistivity of dislocations in aluminium;Rider;Philos. Mag.,1966

2. Calculation of electrical resistivity produced by dislocations in various metals;Watts;J. Phys. F Met. Phys.,1988

3. The determination of dislocation densities in thin films;Ham;Philos. Mag.,1961

4. The dislocation distribution, flow stress, and stored energy in cold-worked polycrystalline silver;Bailey;Philos. Mag.,1960

5. Electron Microscopy of Thin Crystals;Hirsch,1965

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