High resolution crystal orientation mapping of ultrathin films in SEM and TEM-Reference-Cited by-同舟云学术

High resolution crystal orientation mapping of ultrathin films in SEM and TEM

Published:2022-07 Issue: Volume:189 Page:111931
ISSN:1044-5803
Container-title:Materials Characterization
language:en
Short-container-title:Materials Characterization

Author:

Heinig Mario F.,Chatterjee Dipanwita,van Helvoort Antonius T.J.,Wagner Jakob Birkedal,Kadkhodazadeh Shima,Ånes Håkon Wiik,Niessen Frank,da Silva Fanta Alice Bastos

Funder

Horizon 2020

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

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