Formation mechanism, interface characteristics and the application of metal/SiC thin-film ohmic contact after high-temperature treatment-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Formation mechanism, interface characteristics and the application of metal/SiC thin-film ohmic contact after high-temperature treatment

Published:2023-05 Issue: Volume:24 Page:2428-2441
ISSN:2238-7854
Container-title:Journal of Materials Research and Technology
language:en
Short-container-title:Journal of Materials Research and Technology

Author:

Wu Chen,Fang Xudong^ORCID,Kang Qiang,Fang Ziyan,Sun Hao,Zhang Dong,Zhao Libo,Tian Bian,Maeda Ryutaro,Jiang Zhuangde

Publisher

Elsevier BV

Subject

Metals and Alloys,Surfaces, Coatings and Films,Biomaterials,Ceramics and Composites

Reference74 articles.

1. SiC sensors: a review;Wright;J Phys D Appl Phys,2007

2. Prospects for SiC electronics and sensors;Wright;Mater Today,2008

3. Advances in silicon carbide science and technology at the micro and nanoscales;Maboudian;J Vacuum Sci Technol Vacuum Surf Films,2013

4. Silicon carbide for MEMS and NEMS-an overview;Zorman;Sensors, IEEE.,2002

5. Silicon carbide as base material for MEMS sensors of aerospace use: an overview;Fraga;Materia,2014

Cited by 7 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Experimental study of ignition process caused by poor electrical contact of connecter;Process Safety and Environmental Protection;2024-09

2. Microscopic evidence of carbide formation at the interface of tungsten-based ohmic contacts on diamond;Applied Surface Science;2024-09

3. Membrane hybrid system assembled with MXene@h-BN for efficient typical pharmaceuticals removal and self-cleaning: Synergetic effect on adsorption-photocatalytic process;Chemical Engineering Journal;2024-08

4. Studies on Structural and Electrical Characterization of Nitrogen Doped SiC Thin Films;2024 International Conference on Smart Systems for applications in Electrical Sciences (ICSSES);2024-05-03

5. Mechanism of solid-state diffusion reaction in vacuum between metal (Fe, Ni, and Co) and 4H–SiC;Ceramics International;2024-05

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3