Hitachi's Development of Cold-Field Emission Scanning Transmission Electron Microscopes-Reference-Cited by-同舟云学术

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Hitachi's Development of Cold-Field Emission Scanning Transmission Electron Microscopes

Published:2009 Issue: Volume: Page:123-186
ISSN:1076-5670
Container-title:Advances in Imaging and Electron Physics
language:
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Author:

Inada Hiromi,Kakibayashi Hiroshi,Isakozawa Shigeto,Hashimoto Takahito,Yaguchi Toshie,Nakamura Kuniyasu

Publisher

Elsevier

Reference85 articles.

1. Digital computer techniques in electron microscopy;Butler;6th Int. Cong. for Electron Microscopy (Kyoto),1966

2. STRJ Report 1999,1999

3. Japan Electronics and Information Technology Industries Association

4. Scanning techniques for high voltage microscope;Crewe,1964

5. Towards the ultimate scanning electron microscope;Crewe,1985

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