Chapter 10 Spherical Aberration-Corrected Transmission Electron Microscopy for Nanomaterials-Reference-Cited by-同舟云学术

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Chapter 10 Spherical Aberration-Corrected Transmission Electron Microscopy for Nanomaterials

Published:2008 Issue: Volume: Page:385-437
ISSN:1076-5670
Container-title:Advances in Imaging and Electron Physics
language:
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Author:

Tanaka Nobuo

Publisher

Elsevier

Reference84 articles.

1. Lattice-resolution contrast from a focused coherent electron probe;Allen;Ultramicroscopy,2003

2. A quadrupole-octupole corrector for 100 keV STEM;Beck,1974

3. A hexapole spherical aberration corrector;Beck;Optik,1979

4. Depth sectioning of aligned crystals with the aberration corrected scanning transmission electron microscope;Borisevich;J. Electr. Microsc.,2006

5. “Principles of Optics,”;Born,1970

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Electron Ptychographic Diffractive Imaging of Boron Atoms in LaB6 Crystals;Scientific Reports;2017-06-06

2. Nanoscale Hollow Spheres: Microemulsion-Based Synthesis, Structural Characterization and Container-Type Functionality;Materials;2010-08-12

3. Nanoparticulate Functional Materials;Angewandte Chemie International Edition;2010-01-27

4. Nanopartikuläre Funktionsmaterialien;Angewandte Chemie;2010-01-27

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