Evidence of a two-stage reaction mechanism in sputter deposited Nb/Al multilayer thin-films studied by in situ synchrotron X-ray diffraction
Author:
Publisher
Elsevier BV
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Reference19 articles.
1. Sequence of phase formation in Nb/Al multilayered samples
2. Phase formation sequence for the reaction of multilayer thin films of Nb/Al
3. Formation of the first phase in sputter-deposited Nb/Al multilayer thin films
4. Thin film reaction kinetics of niobium/aluminum multilayers
5. Experimental evidence for nucleation during thin‐film reactions
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