Electronic processes during the sputtering of atoms from metallic surfaces studied by resonance laser ionization spectroscopy-Reference-Cited by-同舟云学术

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Electronic processes during the sputtering of atoms from metallic surfaces studied by resonance laser ionization spectroscopy

Published:2003-06 Issue:6 Volume:58 Page:1147-1154
ISSN:0584-8547
Container-title:Spectrochimica Acta Part B: Atomic Spectroscopy
language:en
Short-container-title:Spectrochimica Acta Part B: Atomic Spectroscopy

Author:

Bastiaansen Jeroen,Vervaecke Frederik,Vandeweert Erno,Lievens Peter,Silverans Roger E.

Publisher

Elsevier BV

Subject

Spectroscopy,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry

Reference20 articles.

1. Laser Photoionization Spectroscopy;Lethokov,1987

2. Principles and Applications of Resonance Ionization Spectroscopy;Hurst,1988

3. Sputtering by Particle Bombardment I, Topics in Applied Physics, Vol. 47;Behrisch,1981

4. Sputtering by Particle Bombardment II, Topics in Applied Physics, Vol. 52;Behrisch,1983

5. Sputtering by particle bombardment III, Topics in Applied Physics, Vol, 64;Behrisch,1991

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Resonance Ionization Mass Spectrometry ( RIMS ): Fundamentals and Applications Including Secondary Neutral Mass Spectrometry;Photoionization and Photo‐Induced Processes in Mass Spectrometry;2020-10-09

2. Electronic excitation of uranium atoms sputtered from uranium metal and oxides;Spectrochimica Acta Part B: Atomic Spectroscopy;2018-11

3. Development of resonance-enhanced multiphoton ionization SNMS for state-selective detection of sputtered atoms under low-energy ion irradiation;Surface and Interface Analysis;2011-01-26

4. Enhancement of Excited Secondary Fe Atoms under Oxygen Ion Bombardment;e-Journal of Surface Science and Nanotechnology;2009

5. Application of resonant laser postionization SNMS for quantitative depth profiling in stainless steel with oxide film;Applied Surface Science;2008-12

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