The characterization of semiconductor layer and interface quality with special reference to raman spectroscopy-Reference-Cited by-同舟云学术

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The characterization of semiconductor layer and interface quality with special reference to raman spectroscopy

Published:1996-01 Issue:4 Volume:32 Page:185-224
ISSN:0960-8974
Container-title:Progress in Crystal Growth and Characterization of Materials
language:en
Short-container-title:Progress in Crystal Growth and Characterization of Materials

Author:

Geurts J.

Publisher

Elsevier BV

Subject

Condensed Matter Physics,General Materials Science

Reference94 articles.

1. Light Scattering in Solids, Topics in Applied Physics 8, 50, 51, 54, 66, 68, eds. M. Cardona and G. Güntherodt, Springer, Berlin, Heidelberg, New York.

2. Light Scattering in Solids;Hayes,1978

3. Resonant Raman Scattering in Semiconductors;Richter,1976

4. Analytical Raman Spectroscopy;Pollak,1991

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