Raman characterization of semiconducting materials and related structures
Author:
Publisher
Elsevier BV
Subject
Condensed Matter Physics,General Materials Science
Reference125 articles.
1. Strain induced phonon line broadening observed by surface reflection Raman scattering
2. Observations of phonon line broadening in the III-V semiconductors by surface reflection Raman scattering
3. Raman spectroscopy—A versatile tool for characterization of thin films and heterostructures of GaAs and AlxGa1−xAs
4. Light Scattering in Solids I,1975
5. Light Scattering in Solids II,1982
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