Measurement of uncompensated resistance and double layer capacitance during the course of a dynamic measurement: correction for IR drop and charging currents in arbitrary voltammetric techniques-Reference-Cited by-同舟云学术

Measurement of uncompensated resistance and double layer capacitance during the course of a dynamic measurement: correction for IR drop and charging currents in arbitrary voltammetric techniques

Published:1996-12 Issue:1 Volume:419 Page:99-103
ISSN:1572-6657
Container-title:Journal of Electroanalytical Chemistry
language:en
Short-container-title:Journal of Electroanalytical Chemistry

Author:

Aberg Svante

Publisher

Elsevier BV

Subject

Electrochemistry,General Chemical Engineering,Analytical Chemistry

Reference9 articles.

1. Convolution potential sweep voltammetry

2. Electrochemical evaluation of charge-transport rates in polypyrrole

3. S. Aberg, in preparation.

4. Effect of uncompensated resistance on large-amplitude chronoamperometric experiments

5. A theoretical expression for the effect of IR drop on the current response in a potential step experiment

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