A review of electrostatic discharge mechanisms and on-chip protection techniques to ensure device reliability-Reference-Cited by-同舟云学术

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A review of electrostatic discharge mechanisms and on-chip protection techniques to ensure device reliability

Published:1990-02 Issue:2 Volume:24 Page:111-130
ISSN:0304-3886
Container-title:Journal of Electrostatics
language:en
Short-container-title:Journal of Electrostatics

Author:

Avery L.R.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Biotechnology,Electronic, Optical and Magnetic Materials

Reference33 articles.

1. Critical considerations for ESD testing;Hyatt,1984

2. A closer look at the human ESD event;Hyatt,1981

3. A programmable equipment for electrostatic discharge testing to human body models;Enoch,1983

4. The characterization and control of leading edge transients from human body model ESD simulators;DeChiaro,1985

5. Variations in failure modes and cumulative effects produced by commercial human body model ESD simulators;Strauss,1987

Cited by 7 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. The triboelectricity of the human body;Nano Energy;2021-08

2. Physics and Models of an ESD Event;ESD Design and Analysis Handbook;2003

3. Electrostatic discharge in semiconductor devices: protection techniques;Proceedings of the IEEE;2000-12

4. Electrostatic discharge in semiconductor devices: an overview;Proceedings of the IEEE;1998

5. Charge meter of electrostatic discharges;Journal of Electrostatics;1993-05

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