Trapping and Detrapping Effects on Current Conduction Mechanisms at Interface of Au/HfO2 High-k Films
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Published:2015-12
Issue:12
Volume:44
Page:2992-2995
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ISSN:1875-5372
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Container-title:Rare Metal Materials and Engineering
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language:en
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Short-container-title:Rare Metal Materials and Engineering
Author:
Yuqian Zhang,Li Fu