Schottky IRCCD Thermal Imaging-Reference-Cited by-同舟云学术

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Schottky IRCCD Thermal Imaging

Published:1980 Issue: Volume: Page:495-512
ISSN:0065-2539
Container-title:Advances in Electronics and Electron Physics
language:
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Author:

Shepherd F.D.,Taylor R.W.,Skolnik L.H.,Capone B.R.,Roosild S.A.,Kosonocky W.F.,Kohn E.S.

Publisher

Elsevier

Reference17 articles.

1. Silicon Schottky Barrier Monolithic IRTV Focal Planes

2. Proc. of IRIS Thermal Imaging Meeting;Shepherd,1977

3. Kohn, E. S., Roosild, S. A., Shepherd, F. D., and Yang, A. C., “Proc. International Conference on Application of CCDs” (1975)

4. IRIS Detector Speciality Group Meeting;Taylor,1977

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Temperature dependence of noise equivalent temperature change of Pt∕Si∕p-Si composites in the 3–5μm wavelength range;Applied Physics Letters;2006-02-27

2. Quantum efficiencies of PtSi∕p-Si composites in the 3–5μm wavelength range;Applied Physics Letters;2005-12-05

3. Solid-State Infrared Imaging;VLSI Electronics Microstructure Science;1982

4. Design, Fabrication, and Performance of CCD Imagers;VLSI Electronics Microstructure Science;1982

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