Alternating-current thin-film electro-luminescent devices: Effect of fabrication conditions on aging and failure defect formation-Reference-Cited by-同舟云学术

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Alternating-current thin-film electro-luminescent devices: Effect of fabrication conditions on aging and failure defect formation

Published:1998-01 Issue:2-3 Volume:37 Page:123-167
ISSN:0960-8974
Container-title:Progress in Crystal Growth and Characterization of Materials
language:en
Short-container-title:Progress in Crystal Growth and Characterization of Materials

Author:

Krasnov Alex N.

Publisher

Elsevier BV

Subject

Condensed Matter Physics,General Materials Science

Reference217 articles.

1. SID Int. Symp. Digest;Inoguchi,1974

2. Optical interference, contrast-enhanced electroluminescent device

3. Dig. SID Int. Symp;Suzuki,1976

4. Dig. SID Int. Symp;Suzuki,1976

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