Thickness dependent properties of quasi-layered MgGeN2 thin films-Reference-Cited by-同舟云学术

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Thickness dependent properties of quasi-layered MgGeN2 thin films

Published:2023-04 Issue: Volume:337 Page:133860
ISSN:0167-577X
Container-title:Materials Letters
language:en
Short-container-title:Materials Letters

Author:

Feng Qingguo

Funder

International Science and Technology Cooperation Program of Sichuan Province

Southwest Jiaotong University

Sichuan Province Science and Technology Support Program

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference25 articles.

1. Synthesis, structure, and optoelectronic properties of II–IV–V2materials

2. Verfeinerung der Struktur des Nitrids MgSiN2 - eine Neutronenbeugungsuntersuchung / A Refinement of the Structure of the Nitride MgSiN2 - a Study by Neutron Diffraction

3. C. M. Fang et. al., J. Phys.: Condens. Matter 11, 4833 (1999).

4. L. C. Tang et. al., Proc. of SPIE 7056, 705605 (2008).

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