Nanoscale investigation of ferroelectric and piezoelectric properties in (Pb,Ca)TiO3 thin films grown on LaNiO3/LaAlO3(1 0 0) and Pt/Si(1 1 1) using piezoresponse force microscopy-Reference-Cited by-同舟云学术

Nanoscale investigation of ferroelectric and piezoelectric properties in (Pb,Ca)TiO3 thin films grown on LaNiO3/LaAlO3(1 0 0) and Pt/Si(1 1 1) using piezoresponse force microscopy

Published:2017-06 Issue: Volume:196 Page:64-68
ISSN:0167-577X
Container-title:Materials Letters
language:en
Short-container-title:Materials Letters

Author:

Capeli R.A.,Pontes F.M.,Pontes D.S.L.,Chiquito A.J.,Bastos W.B.,Pereira-da-Silva Marcelo A.,Longo E.

Funder

FAPESP

CNPq

CEPID/CMDMC/INCTMN/CDMF

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

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