Tuning the structure and magnetic softness of thin permalloy films by variations in the thickness of titanium seed layer-Reference-Cited by-同舟云学术

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Tuning the structure and magnetic softness of thin permalloy films by variations in the thickness of titanium seed layer

Published:2015-08 Issue: Volume:152 Page:159-162
ISSN:0167-577X
Container-title:Materials Letters
language:en
Short-container-title:Materials Letters

Author:

Svalov A.V.,Kurlyandskaya G.V.,González Asensio B.,Collantes J.M.,Larrañaga A.

Funder

Spanish Government

Ministry of Education and Science of the Russian Federation

Basque Government and UPV-EHU

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference14 articles.

1. High magnetoresistance in sputtered permalloy thin films through growth on seed layers of (Ni0.81Fe0.19)1−xCrx;Lee;IEEE Trans Magn,2000

2. Exchange coupling in Fe50Mn50/Ni81Fe19 bilayer: dependence on antiferromagnetic layer thickness;Sang;J Appl Phys,1999

3. Seed layer effect on texture and magnetic properties of SmCo5 thin films;Zhang;J Appl Phys,2009

4. Effect of Ti seed layer on the magnetization reversal process of Co/NiFe/Al-oxide/NiFe junction films;Yu;J Appl Phys,2002

5. Effect of Ti seed layers on structure of self-organized epitaxial face-centered-cubic-Ag (001) oriented nanodots;Kamiko;J Appl Phys,2013

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1. Influence of sputter pressure on magnetic and structural properties of Permalloy thin films;Journal of Magnetism and Magnetic Materials;2023-11

2. 57Fe Mössbauer and magneto-optical Kerr effect (MOKE) study of transcritical state in permalloy (FexNi100-x) thin films;Hyperfine Interactions;2021-11-15

3. Amorphization of thin supermalloy films Ni79Fe17Mo4 with oxygen during magnetron sputtering;Journal of Alloys and Compounds;2021-02

4. Effect of Bias Voltage and Deposition Rate on the Structure and Coercivity of NiFe Films;Physics of the Solid State;2020-12

5. Impurity and texture driven HCP-to-FCC transformations in Ti-X thin films during in situ TEM annealing and FIB milling;Acta Materialia;2020-02

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