Author:
Martinsons Christophe,Heuret Michel
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Reference8 articles.
1. Thermal-wave detection and thin-film thickness measurements with laser beam deflection
2. D. Fournier, A.C. Boccara, Photothermal investigations of solids, basic physical principle. In: Photothermal Investigation of Solids and Fluids, Academic Press, 1988, p. 35.
3. Thermal diffusivity measurement of micron-thick semiconductor films by mirage detection
4. Micron‐scale thermal characterizations of interfaces parallel or perpendicular to the surface
5. C. Martinsons, V. Picol, F. Imbach, M. Heuret, Photothermal Analysis of PVD TiN Coatings, presented at the 5th International Symposium on Trends and New Applications in Thin Films, Colmar France—April 1996, Special Issue of Le Vide Sciences Technique et Applications, 279 (1996) 176.
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8 articles.
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