PEELS and EXELFS characterization of diamond films grown by the HF-CVD technique on non-scratched Si substrates-Reference-Cited by-同舟云学术

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PEELS and EXELFS characterization of diamond films grown by the HF-CVD technique on non-scratched Si substrates

Published:1997-07 Issue:1-2 Volume:304 Page:45-47
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Duarte-Moller A.,Contreras O.,Hirata G.A.,Avalos-Borja M.,Galván D.H.,Morales de la Garza L.,Cota-Araiza L.

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference22 articles.

1. Extended energy loss fine structure measurement above shallow and deep core levels of 3d transition metals

2. Structural determination of crystalline silicon by extended energy-loss fine-structure spectroscopy

3. Extended energy loss fine structures (EELFS): A new structural probe for surfaces and interfaces

4. Local structure of graphite by EELFS spectroscopy: Influence of multiple plasmons and orientational dependence

5. Structural and electronic studies of clean and oxidized thin Fe films on polycrystalline copper

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. The uniformity study of non-oxide thin film at device level using electron energy loss spectroscopy;AIP Advances;2018-05

2. Structural Analysis of Buried Amorphous Layer in Oxygen-Ion-Implanted Silicon Carbide;Journal of the Japan Institute of Metals;2001

3. Interface analysis of CVD diamond on TiN surfaces;Applied Surface Science;2000-05

4. RAMAN AND PEELS STUDIES ON MAGNETRON SPUTTERED a-C;International Journal of Modern Physics B;2000-01-30

5. Scanning Transmission Electron Microscopy-Energy Dispersive X-Ray/Electron Energy Loss Spectroscopy Studies on SiC-on-Insulator Structures;Journal of The Electrochemical Society;2000

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