Depth-sensitive strain analysis of a W–Ta–W trilayer-Reference-Cited by-同舟云学术

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Depth-sensitive strain analysis of a W–Ta–W trilayer

Published:1997-06 Issue:1-2 Volume:301 Page:55-61
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Malhotra S.G,Rek Z.U,Yalisove S.M,Bilello J.C

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference29 articles.

1. N.N. Davidenkov, Sov. Phys., Solid State 2 (1961) 2595.

2. H. Windischmann, Crit. Rev. Solid State Mater. Sci. 17 (1992) 547.

3. C. Montcalm, B.T. Sullivan, H. Pepin, J.A. Dobrowolski and M. Sutton, Appl. Optics 33 (1994) 2057.

4. M. Vill, D.P. Adams, S.M. Yalisove and J.C. Bilello, Acta. Metall. Mater. 43 (1995) 427.

5. D.P. Adams, M. Vill, J. Tao, J.C. Bilello and S.M. Yalisove, J. Appl. Phys. 74 (1993) 1015.

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