Microstructural changes of CdTe during the annealing process-Reference-Cited by-同舟云学术

Microstructural changes of CdTe during the annealing process

Published:2002-02 Issue: Volume:403-404 Page:522-525
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Chapman A.J,Lane D.W,Rogers K.D,Özsan M.E

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference9 articles.

1. Structural dynamics in CdS–CdTe thin films

2. Novel depth profiling in Cds-CdTe thin films

3. The structural changes in CdS-CdTe thin films due to annealing

4. M.E. Ozsan, D.R.Johnson, M. Sadeghi, D. Sivapathhasundaram, Proceedings of the Ninth EUROCAD Meeting, Zurich, 17–18th November, 1994.

5. A.J. Chapman, D.W. Lane, K.D.0 Rogers, M.E. Ozsan, L.M. Peter, Proceedings of the Sixteenth European Photovoltaic Solar Energy Conference, Glasgow, UK, 1–5 th May 2000.

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