Chemical analysis of NiAlFe thin films sputter deposited onto sapphire substrates-Reference-Cited by-同舟云学术

Chemical analysis of NiAlFe thin films sputter deposited onto sapphire substrates

Published:1998-09 Issue:2 Volume:330 Page:132-138
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Silvain J.F.,Carney Tim

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference19 articles.

1. R.D. Field, J.R. Dobbs, K.M. Chang, E.H. Goldman, D.G. Konitzer, in: C.T. Liu, R.W. Cahn, G. Sauthoff (Eds.), Ordered Intermetallics-Physical Metallurgy and Mechanical Behaviour, Kluwer, Dordrecht, 1992, pp. 679–698.

2. N.S. Stoloff, in: C.C. Koch, C.T. Lui, N.S. Stoloff (Eds.), High-Temperature Ordered Intermetallics Alloys, MRS Symp. Proc., Vol. 39, MRS, Pittsburgh, PA, 1985, pp. 3–27.

3. J.R. Stephens, in: C.C. Koch, C.T. Lui, N.S. Stoloff (Eds.), High-Temperature Ordered Intermetallics Alloys, MRS Symp. Proc., Vol. 39, MRS, Pittsburgh, PA, 1985, pp. 381–395.

4. A.K. Misra, Thermodynamic Analysis of Compatibility of Several Reinforcement Materials With Beta Phase NiAl Alloys, NASA Contractor Report 4171, Case Western Reserve University, Cleveland, OH, 1988.

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2. Shallow implantation of Ti+ ions in sapphire [α-Al2O3(0001)];Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1999-08