The growth of metallic multilayers on semiconductor substrates and in-situ optical monitoring: the case of Co/Cu on silicon with Pb impurity-Reference-Cited by-同舟云学术

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The growth of metallic multilayers on semiconductor substrates and in-situ optical monitoring: the case of Co/Cu on silicon with Pb impurity

Published:1998-04 Issue:1-2 Volume:318 Page:172-176
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Armour P.,Emmerson C.M.,Shen T.-H.,Evans S.D.,Rainford B.D.

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference10 articles.

1. Giant magnetoresistance in antiferromagnetic Co/Cu multilayers

2. Surfactant-Induced Suppression of Twin Formation During Growth of fcc Co/Cu Superlattices on Cu(111)

3. Surfactant-Mediated Modification of the Magnetic Properties of Co/Cu(111) Thin Films and Superlattices

4. C.M. Emmerson, PhD. Thesis, University of Leeds, 1997.

5. Step structure and dimer row correlations in vicinal Si(100)

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1. CoCu;Magnetic Properties of Metals: Magnetic and Electric Properties of Magnetic Metallic Multilayers;2022

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