Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Reference51 articles.
1. Handbook of Modern Ion Beam Material Analysis;Tesmer,1995
2. H. Oechner, ed., Thin Film and Depth Profile Analysis, Current Physics vol. 37 Springer, Berlin, 1984
3. Fundamentals of Surface and Thin Film Analysis, (Prentice Hall, Englewood Cliffs, NJ);Feldman,1986
4. Backscattering Spectrometry (Academic Press, New York);Chu,1978
5. J. Tirira, Y., Serruys, P. Trocellier, eds. Forward Recoil Spectrometry (Plenum Press, New York & London, 1996).
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