Effect of strain and stoichiometry on the ferroelectric and pyroelectric properties of the epitaxial Pb(Zr0.2Ti0.8)O3 films deposited on Si wafers

Author:

Chirila Cristina,Boni Georgia Andra,Filip Lucian Dragos,Husanu Marius,Neatu Stefan,Istrate Cosmin Marian,Rhun Gwenael Le,Vilquin Bertrand,Trupina Lucian,Pasuk Iuliana,Botea Mihaela,Pintilie Ioana,Pintilie Lucian

Funder

Institutul de Fizică Atomică

Agence Nationale de la Recherche

Unitatea Executiva pentru Finantarea Invatamantului Superior, a Cercetarii, Dezvoltarii si Inovarii

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference44 articles.

1. Ferroelectric Devices;Uchino,2000

2. Ferroelectric Memories;Scott,2000

3. M. Professor Okuyama, Y. Ishibashi, eds., Ferroelectric Thin Films, Springer Berlin Heidelberg, Berlin, Heidelberg, 2005. http://link.springer.com/10.1007/b99517 (accessed March 26, 2015).

4. Piezoelectric Ceramics;Jaffe,2012

5. Composition and orientation dependence of electrical properties of epitaxial Pb(ZrxTi1−x)O3 thin films grown using metalorganic chemical vapor deposition;Oikawa;J. Appl. Phys.,2004

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