Raman scattering investigations on disorder and recovery induced by low and high energy ion irradiation on 3C-SiC

Author:

Sreelakshmi N.,Amirthapandian S.,Umapathy G.R.,David C.,Srivastava S.K.,Ojha S.,Panigrahi B.K.

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference71 articles.

1. Silicon carbide as a platform for power electronics;Eddy;Science,2009

2. Status of silicon carbide (SiC) as a wide-bandgap semiconductor for high-temperature applications: A review;Casady;High-Temp. Electron.,1998

3. A silicon carbide room-temperature single-photon source;Castelletto;Nat. Mater.,2013

4. Radiation resistance of silicon carbide schottky diode detectors in D-T fusion neutron detection;Liu;Sci. Rep.,2017

5. Handbook of SiC properties for fuel performance modeling;Snead;J. Nucl. Mater.,2007

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