Author:
Eyben P.,Janssens T.,Vandervorst W.
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Reference18 articles.
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2. Characterization of a point‐contact on silicon using force microscopy‐supported resistance measurements
3. Recent insights into the physical modeling of the spreading resistance point contact
4. Progress towards a physical contact model for scanning spreading resistance microscopy
5. P. Eyben, D. Degryse, W. Vandervorst, International Conference on Characterization and Metrology For ULSI Technology, March 2005, Dallas, USA, AIP Conf. Proc., submitted for publication.
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